About the Interfacial Multiphysics Lab
The Interfacial Multiphysics Lab focuses on answering the following research questions:
How does a material microstructure evolve during processing (Making of Material) or during evolution (Birth of Material)?
Does a material's microstructure (or mesostructure or macrosctucture) play an important role in determining performance of material? A lot of engineering problems can be solved without microstructure. Then, why bother? Can material microstructure be represented by a number/variable?
If material microstructure is indeed important, then what are the roles of material defining features, that range in scale from atomic to meter length scale, in determining material behavior? What must be taken into account and what can simply be ignored?
If conventional material microstructures/mesostructures/macrostructures do not serve their purpose, can one explore nature to suggest new material designs?
Are conventional experiments appropriate for discovering new structure-property relationships in materials? What fundamental experimental advances could be made in order to facilitate faster and thorough answer to the above questions?
These questions are challenging. Our lab members try to attempt to solve these questions using a suite of tools developed in our lab that are further described on the Research sub-page.
Below are a couple of articles that mention few research sub-topics that were addressed in past by the lab.
Magazine Articles and Latest News
A new analytic technology developed in the lab-referred to as Nanomechanical Raman Spectroscopy reveals important temperature dependent surface stress traits at micro-scale in materials undergoing deformation. News Release Links:
Purdue, Phys.Org, nanowerk, hispanicbusiness
1. Gan, M., and Tomar, V., 2014, Surface stress variation as a function of applied compressive stress and temperature in microscale silicon, AIP Journal of Applied Physics, Vol. 116, 073502 (10 pages)
2. Gan, M., and Tomar, V., 2014, A Raman Spectroscopy Based Investigation of Thermal Conductivity of Stressed Silicon Micro-Cantilevers, to Appear in AIAA Journal of Thermophysics and Heat Transfer.
3. Gan, M., and Tomar, V., 2014, Temperature dependent microscale uniaxial creep of silicon and surface dominated deformation mechanisms, ASME Journal of Nanotechnology in Engineering and Medicine, 5, 021004 (2014) (9 pages).
4. Gan, M., and Tomar, V., 2014, An in-situ platform for the investigation of Raman shift in micro-scale silicon structures as a function of mechanical stress and temperature increase, AIP Review of Scientific Instruments, Volume 85, Pages 013902 (1-10).
Using Experiments with Small Scale Modeling to Understand Interfaces in Biological and Biomimetic Materials